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"A Test Structure to Analyze Electrical CMOSFET Reliabilities between ..."

Takashi Ohzone et al. (2007)

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DOI: 10.1093/IETELE/E90-C.2.515

access: closed

type: Journal Article

metadata version: 2020-04-11

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Takashi Ohzone, Eiji Ishii, Takayuki Morishita, Kiyotaka Komoku, Toshihiro Matsuda, Hideyuki Iwata:
A Test Structure to Analyze Electrical CMOSFET Reliabilities between Center and Edge along the Channel Width. IEICE Trans. Electron. 90-C(2): 515-522 (2007)

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