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"Layer Error Characteristics of Lattice-Reduction Aided V-BLAST Detectors."

Tien Duc Nguyen, Xuan Nam Tran, Tadashi Fujino (2006)

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DOI: 10.1093/IETFEC/E89-A.10.2535

access: closed

type: Journal Article

metadata version: 2020-04-11

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  - https://dblp.org/rec/journals/ieicet/NguyenTF06
Tien Duc Nguyen, Xuan Nam Tran, Tadashi Fujino:
Layer Error Characteristics of Lattice-Reduction Aided V-BLAST Detectors. IEICE Trans. Fundam. Electron. Commun. Comput. Sci. 89-A(10): 2535-2542 (2006)

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