"A DFT Selection Method for Reducing Test Application Time of System-on-Chips."

Masahide Miyazaki et al. (2004)

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type: Journal Article

metadata version: 2020-04-11

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Masahide Miyazaki, Toshinori Hosokawa, Hiroshi Date, Michiaki Muraoka, Hideo Fujiwara:
A DFT Selection Method for Reducing Test Application Time of System-on-Chips. IEICE Trans. Inf. Syst. 87-D(3): 609-619 (2004)

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