"Layout-Aware Variability Characterization of CMOS Current Sources."

Bo Liu, Bo Yang, Shigetoshi Nakatake (2012)

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DOI: 10.1587/TRANSELE.E95.C.696

access: closed

type: Journal Article

metadata version: 2020-04-11

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Bo Liu, Bo Yang, Shigetoshi Nakatake:
Layout-Aware Variability Characterization of CMOS Current Sources. IEICE Trans. Electron. 95-C(4): 696-705 (2012)

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