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"On Reducing Test Power, Volume and Routing Cost by Chain Reordering and ..."

Chia-Yi Lin, Li-Chung Hsu, Hung-Ming Chen (2010)

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DOI: 10.1587/TRANSELE.E93.C.369

access: closed

type: Journal Article

metadata version: 2020-04-11

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  - https://dblp.org/rec/journals/ieicet/LinHC10
Chia-Yi Lin, Li-Chung Hsu, Hung-Ming Chen:
On Reducing Test Power, Volume and Routing Cost by Chain Reordering and Test Compression Techniques. IEICE Trans. Electron. 93-C(3): 369-378 (2010)

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