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"Power Reduction during Scan Testing Based on Multiple Capture Technique."

Lung-Jen Lee, Wang-Dauh Tseng, Rung-Bin Lin (2008)

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DOI: 10.1093/IETELE/E91-C.5.798

access: closed

type: Journal Article

metadata version: 2020-04-11

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Lung-Jen Lee, Wang-Dauh Tseng, Rung-Bin Lin:
Power Reduction during Scan Testing Based on Multiple Capture Technique. IEICE Trans. Electron. 91-C(5): 798-805 (2008)

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