"Soft Error Hardened Latch Scheme with Forward Body Bias in a 90-nm ..."

Yoshihide Komatsu, Yukio Arima, Koichiro Ishibashi (2006)

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DOI: 10.1093/IETELE/E89-C.3.384

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type: Journal Article

metadata version: 2020-04-11

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Yoshihide Komatsu, Yukio Arima, Koichiro Ishibashi:
Soft Error Hardened Latch Scheme with Forward Body Bias in a 90-nm Technology and Beyond. IEICE Trans. Electron. 89-C(3): 384-391 (2006)

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