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"A Reliable 1T1C FeRAM Using a Thermal History Tracking 2T2C Dual Reference ..."

Shoichiro Kawashima et al. (2007)

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DOI: 10.1093/IETELE/E90-C.10.1941

access: closed

type: Journal Article

metadata version: 2020-04-11

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  - journals/ieicet/KawashimaFMNNYHE07
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  - https://dblp.org/rec/journals/ieicet/KawashimaFMNNYHE07
Shoichiro Kawashima, Isao Fukushi, Keizo Morita, Ken-ichi Nakabayashi, Mitsuharu Nakazawa, Kazuaki Yamane, Tomohisa Hirayama, Toru Endo:
A Reliable 1T1C FeRAM Using a Thermal History Tracking 2T2C Dual Reference Level Technique for a Smart Card Application Chip. IEICE Trans. Electron. 90-C(10): 1941-1948 (2007)

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