"Highly Reliable Submicron InP-Based HBTs with over 300-GHz ..."

Norihide Kashio et al. (2008)

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DOI: 10.1093/IETELE/E91-C.7.1084

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type: Journal Article

metadata version: 2020-04-11

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Norihide Kashio, Kenji Kurishima, Yoshino K. Fukai, Shoji Yamahata:
Highly Reliable Submicron InP-Based HBTs with over 300-GHz f_t. IEICE Trans. Electron. 91-C(7): 1084-1090 (2008)

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