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"Test Pattern Ordering and Selection for High Quality Test Set under ..."

Michiko Inoue et al. (2012)

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DOI: 10.1587/TRANSINF.E95.D.3001

access: closed

type: Journal Article

metadata version: 2020-04-11

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  - journals/ieicet/InoueTYF12
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  persistent URL:
  - https://dblp.org/rec/journals/ieicet/InoueTYF12
Michiko Inoue, Akira Taketani, Tomokazu Yoneda, Hideo Fujiwara:
Test Pattern Ordering and Selection for High Quality Test Set under Constraints. IEICE Trans. Inf. Syst. 95-D(12): 3001-3009 (2012)

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