"An Area-Efficient Scalable Test Module to Support Low Pin-Count Testing."

Tong-Yu Hsieh et al. (2016)

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DOI: 10.1587/TRANSELE.E99.C.404

access: closed

type: Journal Article

metadata version: 2020-04-11

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  - https://dblp.org/rec/journals/ieicet/HsiehWYHL16
Tong-Yu Hsieh, Tai-Ping Wang, Shuo Yang, Chin-An Hsu, Yi-Lung Lin:
An Area-Efficient Scalable Test Module to Support Low Pin-Count Testing. IEICE Trans. Electron. 99-C(3): 404-414 (2016)

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