"Characterization and Modeling of Gate-Induced-Drain-Leakage."

Fabien Gilibert et al. (2005)

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DOI: 10.1093/IETELE/E88-C.5.829

access: closed

type: Journal Article

metadata version: 2020-04-11

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Fabien Gilibert, Denis Rideau, Alexandre Dray, Francois Agut, Michel Minondo, Andre Juge, Pascal Masson, Rachid Bouchakour:
Characterization and Modeling of Gate-Induced-Drain-Leakage. IEICE Trans. Electron. 88-C(5): 829-837 (2005)

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