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"Simulation Study on Dependence of Channel Potential Self-Boosting on ..."
Seongjae Cho et al. (2010)
- Seongjae Cho, Jung Hoon Lee, Yoon Kim, Jang-Gn Yun, Hyungcheol Shin, Byung-Gook Park:
Simulation Study on Dependence of Channel Potential Self-Boosting on Device Scale and Doping Concentration in 2-D and 3-D NAND-Type Flash Memory Devices. IEICE Trans. Electron. 93-C(5): 596-601 (2010)
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