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"Further Study on Coaxial-Probe-Based Two-Thickness-Method for ..."

Chun-Ping Chen et al. (2007)

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DOI: 10.1093/IETELE/E90-C.9.1763

access: closed

type: Journal Article

metadata version: 2020-04-11

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  - https://dblp.org/rec/journals/ieicet/ChenXMA07
Chun-Ping Chen, Deming Xu, Zhewang Ma, Tetsuo Anada:
Further Study on Coaxial-Probe-Based Two-Thickness-Method for Nondestructive and Broadband Measurement of Complex EM-parameters of Absorbing Material. IEICE Trans. Electron. 90-C(9): 1763-1769 (2007)

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