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"Circuit Performance Degradation of Switched-Capacitor Circuit with ..."
Jung-Sheng Chen, Ming-Dou Ker (2008)
- Jung-Sheng Chen, Ming-Dou Ker:
Circuit Performance Degradation of Switched-Capacitor Circuit with Bootstrapped Technique due to Gate-Oxide Overstress in a 130-nm CMOS Process. IEICE Trans. Electron. 91-C(3): 378-384 (2008)
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