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"Substrate effect on radiation-induced charge trapping in buried oxide for ..."
Huilong Zhu et al. (2020)
- Huilong Zhu, Dawei Bi, Xin Xie, Zhiyuan Hu, Zhengxuan Zhang, Shichang Zou:
Substrate effect on radiation-induced charge trapping in buried oxide for partially-depleted SOI NMOSFET. IEICE Electron. Express 17(7): 20200001 (2020)
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