Stop the war!
Остановите войну!
for scientists:
default search action
"Comparison of single-event transients of T-gate core and IO device in 130 ..."
Yunlong Zheng et al. (2016)
- Yunlong Zheng, Ruofan Dai, Zhuojun Chen, Shulong Sun, Zheng Wang, Zehua Sang, Min Lin, Shichang Zou:
Comparison of single-event transients of T-gate core and IO device in 130 nm partially depleted silicon-on-insulator technology. IEICE Electron. Express 13(12): 20160424 (2016)
manage site settings
To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.