BibTeX record journals/ieiceee/YuYXY05

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@article{DBLP:journals/ieiceee/YuYXY05,
  author    = {Chuanzhao Yu and
               Hong Yang and
               Enjun Xiao and
               J. S. Yuan},
  title     = {Voltage stress-induced performance degradation in {NMOSFET} mixer},
  journal   = {{IEICE} Electron. Express},
  volume    = {2},
  number    = {5},
  pages     = {133--137},
  year      = {2005},
  url       = {https://doi.org/10.1587/elex.2.133},
  doi       = {10.1587/elex.2.133},
  timestamp = {Thu, 10 Sep 2020 14:39:40 +0200},
  biburl    = {https://dblp.org/rec/journals/ieiceee/YuYXY05.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
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