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"A physical model of electron trapping/detrapping in electrically stressed ..."

Hongyi Wang et al. (2017)

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DOI: 10.1587/ELEX.14.20170565

access: open

type: Journal Article

metadata version: 2023-12-21

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  - journals/ieiceee/WangLZXZW17
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  - https://dblp.org/rec/journals/ieiceee/WangLZXZW17
Hongyi Wang, Cong Li, Bingbing Zhang, Shunqiang Xu, Liming Zheng, Jianfei Wu:
A physical model of electron trapping/detrapping in electrically stressed oxide. IEICE Electron. Express 14(16): 20170565 (2017)

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