"A high resolution and high linearity 45nm CMOS fully digital voltage ..."

Myunghwan Ryu, Youngmin Kim (2013)

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DOI: 10.1587/ELEX.10.20130400

access: open

type: Journal Article

metadata version: 2021-02-12

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  - https://dblp.org/rec/journals/ieiceee/RyuK13a
Myunghwan Ryu, Youngmin Kim:
A high resolution and high linearity 45nm CMOS fully digital voltage sensor for low power applications. IEICE Electron. Express 10(13): 20130400 (2013)

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