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"CMOS cross-coupled charge pump with improved latch-up immunity."

Su-Jin Park et al. (2009)

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DOI: 10.1587/ELEX.6.736

access: open

type: Journal Article

metadata version: 2021-02-12

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  - electronic edition via DOI (open access)
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  dblp key:
  - journals/ieiceee/ParkKKHJLK09
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  persistent URL:
  - https://dblp.org/rec/journals/ieiceee/ParkKKHJLK09
Su-Jin Park, Yonggu Kang, Joung-Yeal Kim, Tae Hee Han, Young-Hyun Jun, Chil-Gee Lee, Bai-Sun Kong:
CMOS cross-coupled charge pump with improved latch-up immunity. IEICE Electron. Express 6(11): 736-742 (2009)

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