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"A single event upset tolerant latch with parallel nodes."

Changyong Liu et al. (2019)

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DOI: 10.1587/ELEX.16.20190208

access: open

type: Journal Article

metadata version: 2023-05-03

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  dblp key:
  - journals/ieiceee/LiuLLWPZLCZH19
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  - https://dblp.org/rec/journals/ieiceee/LiuLLWPZLCZH19
Changyong Liu, Nianlong Liu, Zhiting Lin, Xiulong Wu, Chunyu Peng, Qiang Zhao, Xuan Li, Junning Chen, Xuan Zeng, Xiangdong Hu:
A single event upset tolerant latch with parallel nodes. IEICE Electron. Express 16(11): 20190208 (2019)

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