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ORCID"Improved stacked-diode ESD protection in nanoscale CMOS technology."
Chun-Yu Lin, Meng-Ting Lin (2017)
- Chun-Yu Lin, Meng-Ting Lin:
Improved stacked-diode ESD protection in nanoscale CMOS technology. IEICE Electron. Express 14(13): 20170570 (2017)
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