"Improved stacked-diode ESD protection in nanoscale CMOS technology."

Chun-Yu Lin, Meng-Ting Lin (2017)

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DOI: 10.1587/ELEX.14.20170570

access: open

type: Journal Article

metadata version: 2025-03-03

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Chun-Yu Lin, Meng-Ting Lin:
Improved stacked-diode ESD protection in nanoscale CMOS technology. IEICE Electron. Express 14(13): 20170570 (2017)

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