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"Effectiveness of the layout approach in mitigating single event transients ..."
Tiehu Li et al. (2018)
- Tiehu Li, Yintang Yang, Liang Li, Jia Liu, Junan Zhang:
Effectiveness of the layout approach in mitigating single event transients in 65-nm bulk CMOS process. IEICE Electron. Express 15(13): 20180540 (2018)
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