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"An experimental study on dynamic junction temperature estimation of SiC ..."
Shuhei Fukunaga et al. (2019)
- Shuhei Fukunaga
, Tsuyoshi Funaki, Shinsuke Harada, Yusuke Kobayashi:
An experimental study on dynamic junction temperature estimation of SiC MOSFET with built-in SBD. IEICE Electron. Express 16(17): 20190392 (2019)
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