"An experimental study on estimating dynamic junction temperature of SiC ..."

Shuhei Fukunaga, Tsuyoshi Funaki (2018)

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DOI: 10.1587/ELEX.15.20180251

access: open

type: Journal Article

metadata version: 2021-10-14

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  - https://dblp.org/rec/journals/ieiceee/FukunagaF18
Shuhei Fukunaga, Tsuyoshi Funaki:
An experimental study on estimating dynamic junction temperature of SiC MOSFET. IEICE Electron. Express 15(8): 20180251 (2018)

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