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"Impact of RF stress on the low-frequency noise in nMOSFETs."

Haipeng Fu et al. (2021)

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DOI: 10.1587/ELEX.18.20210237

access: open

type: Journal Article

metadata version: 2022-02-03

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  - electronic edition via DOI (open access)
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  dblp key:
  - journals/ieiceee/FuNYLM21
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  persistent URL:
  - https://dblp.org/rec/journals/ieiceee/FuNYLM21
Haipeng Fu, Muqian Niu, Liping Yang, Xuguang Li, Kaixue Ma:
Impact of RF stress on the low-frequency noise in nMOSFETs. IEICE Electron. Express 18(14): 20210237 (2021)

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