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"Influence of trapped flux on critical currents of Josephson junctions."

Björn Ebert et al. (2008)

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DOI: 10.1587/ELEX.5.431

access: open

type: Journal Article

metadata version: 2021-02-12

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  - electronic edition via DOI (open access)
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  dblp key:
  - journals/ieiceee/EbertROFU08
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  persistent URL:
  - https://dblp.org/rec/journals/ieiceee/EbertROFU08
Björn Ebert, Torsten Reich, Thomas Ortlepp, Pascal Febvre, F. Hermann Uhlmann:
Influence of trapped flux on critical currents of Josephson junctions. IEICE Electron. Express 5(11): 431-436 (2008)

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