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"Investigation of source-to-drain capacitance by DIBL effect of silicon ..."

Seongjae Cho, In Man Kang, Kyung Rok Kim (2010)

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DOI: 10.1587/ELEX.7.1499

access: open

type: Journal Article

metadata version: 2021-02-12

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  - journals/ieiceee/ChoKK10
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  - https://dblp.org/rec/journals/ieiceee/ChoKK10
Seongjae Cho, In Man Kang, Kyung Rok Kim:
Investigation of source-to-drain capacitance by DIBL effect of silicon nanowire MOSFETs. IEICE Electron. Express 7(19): 1499-1503 (2010)

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