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"Research on the influences of well structure on dose rate effects in 65nm ..."

Qian Chen et al. (2020)

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DOI: 10.1587/ELEX.17.20200205

access: open

type: Journal Article

metadata version: 2021-02-12

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  dblp key:
  - journals/ieiceee/ChenHMLLCL20
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  persistent URL:
  - https://dblp.org/rec/journals/ieiceee/ChenHMLLCL20
Qian Chen, Jianwei Han, Yingqi Ma, Sai Li, Jingtian Liu, Yaqing Chi, Bin Liang:
Research on the influences of well structure on dose rate effects in 65nm CMOS circuit. IEICE Electron. Express 17(14): 20200205 (2020)

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