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ORCID"Analysis and evaluation of noise coupling between through-silicon-vias."
Yuuki Araga et al. (2021)
- Yuuki Araga, Naoya Watanabe, Haruo Shimamoto, Katsuya Kikuchi:
Analysis and evaluation of noise coupling between through-silicon-vias. IEICE Electron. Express 18(11): 20210139 (2021)
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