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ORCID"Time-multiplexed test access architecture for stacked integrated circuits."
Muhammad Adil Ansari et al. (2016)
- Muhammad Adil Ansari, Jihun Jung, Dooyoung Kim, Sungju Park:
Time-multiplexed test access architecture for stacked integrated circuits. IEICE Electron. Express 13(14): 20160314 (2016)
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