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"The inadequacy of the stuck-at fault model for testing mos lsi circuits: a ..."

N. Burgess, Robert I. Damper (1984)

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DOI: 10.1049/SM.1984.0011

access: closed

type: Journal Article

metadata version: 2021-08-13

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  - https://dblp.org/rec/journals/iee-sej/BurgessD84
N. Burgess, Robert I. Damper:
The inadequacy of the stuck-at fault model for testing mos lsi circuits: a review of mos failure mechanisms and some implications for computer-aided design and test of mos lsi circuits. Softw. Microsystems 3(2): 30-36 (1984)

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