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"Technological cognitive diagnosis model for patent keyword analysis."

Sangsung Park, Sunghae Jun (2020)

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DOI: 10.1016/J.ICTE.2019.09.004

access: open

type: Journal Article

metadata version: 2021-01-04

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  dblp key:
  - journals/ict-express/ParkJ20
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  - https://dblp.org/rec/journals/ict-express/ParkJ20
Sangsung Park, Sunghae Jun:
Technological cognitive diagnosis model for patent keyword analysis. ICT Express 6(1): 57-61 (2020)

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