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"Bit-reliability mapping in LDPC-coded modulation systems."

Yan Li, William E. Ryan (2005)

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DOI: 10.1109/LCOMM.200501010

access: closed

type: Journal Article

metadata version: 2020-08-20

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Yan Li, William E. Ryan:
Bit-reliability mapping in LDPC-coded modulation systems. IEEE Commun. Lett. 9(1): 1-3 (2005)

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