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"In-Process Improvement through Defect Data Interpretation."
Inderpal S. Bhandari et al. (1994)
- Inderpal S. Bhandari, Michael J. Halliday, Jarir K. Chaar, Ram Chillarege, K. Jones, J. S. Atkinson, Cleo Lepori-Costello, P. Y. Jasper, E. D. Tarver, C. C. Lewis, M. Yonezawa:
In-Process Improvement through Defect Data Interpretation. IBM Syst. J. 33(1): 182-214 (1994)
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