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"A Contactless Method for High-Sensitivity Measurement of p-n Junction Leakage."

Roger L. Verkuil, Huntington W. Curtis, Mun S. Pak (1980)

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DOI: 10.1147/RD.243.0370

access: closed

type: Journal Article

metadata version: 2020-05-12

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  - journals/ibmrd/VerkuilCP80
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  - https://dblp.org/rec/journals/ibmrd/VerkuilCP80
Roger L. Verkuil, Huntington W. Curtis, Mun S. Pak:
A Contactless Method for High-Sensitivity Measurement of p-n Junction Leakage. IBM J. Res. Dev. 24(3): 370-377 (1980)

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