"LSI yield modeling and process monitoring."

Charles H. Stapper (2000)

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DOI: 10.1147/RD.441.0112

access: closed

type: Journal Article

metadata version: 2020-03-13

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Charles H. Stapper:
LSI yield modeling and process monitoring. IBM J. Res. Dev. 44(1): 112-118 (2000)

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