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"Defect-Related Breakdown and Conduction in SiO2."

Morris Shatzkes, Moshe Av-Ron, Robert A. Gdula (1980)

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DOI: 10.1147/RD.244.0469

access: closed

type: Journal Article

metadata version: 2020-05-12

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  - journals/ibmrd/ShatzkesAG80
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  - https://dblp.org/rec/journals/ibmrd/ShatzkesAG80
Morris Shatzkes, Moshe Av-Ron, Robert A. Gdula:
Defect-Related Breakdown and Conduction in SiO2. IBM J. Res. Dev. 24(4): 469-479 (1980)

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