"Hot-electron effects and oxide degradation in MOS structures studied with ..."

Rudolf Ludeke (2000)

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DOI: 10.1147/RD.444.0517

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type: Journal Article

metadata version: 2020-03-13

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Rudolf Ludeke:
Hot-electron effects and oxide degradation in MOS structures studied with ballistic electron emission microscopy. IBM J. Res. Dev. 44(4): 517-534 (2000)

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