"Partial secondary electron-yield NEXAFS spectromicroscopy with an ..."

Stephen Lynd Christensen et al. (2011)

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DOI: 10.1147/JRD.2011.2143550

access: closed

type: Journal Article

metadata version: 2020-03-13

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Stephen Lynd Christensen, Brian M. Haines, Uday D. Lanke, Matthew F. Paige, Stephen G. Urquhart:
Partial secondary electron-yield NEXAFS spectromicroscopy with an energy-filtered X-PEEM. IBM J. Res. Dev. 55(4): 5 (2011)

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