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"Finite-element analysis of semiconductor devices: The FIELDAY program."

Edward M. Buturla et al. (2000)

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DOI: 10.1147/RD.441.0142

access: closed

type: Journal Article

metadata version: 2020-03-13

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  - https://dblp.org/rec/journals/ibmrd/ButurlaCGS00
Edward M. Buturla, P. E. Cottrell, B. M. Grossman, K. A. Salsburg:
Finite-element analysis of semiconductor devices: The FIELDAY program. IBM J. Res. Dev. 44(1): 142-156 (2000)

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