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"Rapid-turnaround characterization methods for MRAM development."

David William Abraham, Philip Louis Trouilloud, Daniel Christopher Worledge (2006)

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DOI: 10.1147/RD.501.0055

access: closed

type: Journal Article

metadata version: 2020-03-13

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David William Abraham, Philip Louis Trouilloud, Daniel Christopher Worledge:
Rapid-turnaround characterization methods for MRAM development. IBM J. Res. Dev. 50(1): 55-68 (2006)

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