"Probabilistic bisimilarity as testing equivalence."

Yuxin Deng, Yuan Feng (2017)

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DOI: 10.1016/J.IC.2017.09.014

access: closed

type: Journal Article

metadata version: 2022-06-23

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Yuxin Deng, Yuan Feng:
Probabilistic bisimilarity as testing equivalence. Inf. Comput. 257: 58-64 (2017)

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