Stop the war!
Остановите войну!
for scientists:
default search action
"A probabilistic approach to building defect prediction model for ..."
Chang-Kyun Jeon, Neunghoe Kim, Hoh In (2017)
- Chang-Kyun Jeon, Neunghoe Kim, Hoh In:
A probabilistic approach to building defect prediction model for platform-based product lines. Int. Arab J. Inf. Technol. 14(4): 413-422 (2017)
manage site settings
To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.