"Corrections of the NIST Statistical Test Suite for Randomness."

Song-Ju Kim, Ken Umeno, Akio Hasegawa (2004)

> Home

Details and statistics

DOI: —

access: open

type: Informal or Other Publication

metadata version: 2020-05-11

- view
  - electronic edition @ iacr.org (open access)
- export record
  dblp key:
  - journals/iacr/KimUH04
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/iacr/KimUH04
Song-Ju Kim, Ken Umeno, Akio Hasegawa:
Corrections of the NIST Statistical Test Suite for Randomness. IACR Cryptol. ePrint Arch. 2004: 18 (2004)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.