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"Antirandom Test Vectors for BIST in Hardware/Software Systems."

Ireneusz Mrozek, Vyacheslav N. Yarmolik (2012)

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DOI: 10.3233/FI-2012-732

access: closed

type: Journal Article

metadata version: 2020-09-18

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Ireneusz Mrozek, Vyacheslav N. Yarmolik:
Antirandom Test Vectors for BIST in Hardware/Software Systems. Fundam. Informaticae 119(2): 163-185 (2012)

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