Stop the war!
Остановите войну!
for scientists:
default search action
"Radiation-induced Soft Errors: A Chip-level Modeling Perspective."
Norbert Seifert (2010)
- Norbert Seifert:
Radiation-induced Soft Errors: A Chip-level Modeling Perspective. Found. Trends Electron. Des. Autom. 4(2-3): 99-221 (2010)
manage site settings
To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.