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"Data-driven testing methodology for RFID systems."

An Lu et al. (2010)

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DOI: 10.1007/S11704-010-0387-6

access: closed

type: Journal Article

metadata version: 2018-02-19

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An Lu, Wenbin Fang, Chang Xu, Shing-Chi Cheung, Yu Liu:
Data-driven testing methodology for RFID systems. Frontiers Comput. Sci. China 4(3): 354-364 (2010)

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