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"Charge trapping and interface trap generation in thin nitrided silicon ..."
Maurizio Severi et al. (1990)
- Maurizio Severi, Maurizio Irnpronta, Paolo Negrini, Stefano Vassura:
Charge trapping and interface trap generation in thin nitrided silicon dioxide films for VLSI. Eur. Trans. Telecommun. 1(2): 149-153 (1990)
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